TEMPL: A Resource-Efficient and Transparent Model-Free Framework for Pseudo-Label Generation in Material CT Scans
We introduce a multi-stage, model-free framework that generates pseudo-labels directly from grayscale CT scans.
ProofPaper ↗
Key points
- The scarcity of large annotated datasets limits deep learning (DL) segmentation in material CT analysis.
- It combines thresholding, morphological dilation, and a custom breadth-first search region-growing algorithm to produce polygonal annotations without pre-trained weights, labeled data, or a GPU.
- We compare it against the zero-shot Segment Anything Model (SAM), a fully supervised 3D U-Net, and classical baselines.
- These results support our transparent approach as a tool for annotation bootstrapping and microstructural quantification in resource-limited settings.
Sources (1)
- [1]TEMPL: A Resource-Efficient and Transparent Model-Free Framework for Pseudo-Label Generation in Material CT ScansarXiv (AI, ML, NLP, CV, robotics, multi-agent) · Oct 20, 10:48 PM
We introduce a multi-stage, model-free framework that generates pseudo-labels directly from grayscale CT scans.
The scarcity of large annotated datasets limits deep learning (DL) segmentation in material CT analysis.
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